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High speed
USC-F5-k30
Nanoworld
Coating: Gold Reflex Coating
Force Const / Res. Freq:
30 N/m / 5000 kHz

Contact
qp-CONT-10
Nanosensors
Coating: Particl Au
Force Const / Res. Freq:
0.1 N/m / 30 kHz

conductive/EFM
AIOE
Budgetsensors
Coating: Cr/Pt
Force Const / Res. Freq:
0.2 N/m / 15 kHz
2.7 N/m / 80 kHz
7.4 N/m / 150 kHz
40 N/m / 320 kHz

Tapping/Contact
HQ:XSC11/Al BS
MikroMasch
Coating: Aluminum
Force Const / Res. Freq:
0.2 N/m / 15 kHz
2.7 N/m / 80 kHz
7 N/m / 155 kHz
42 N/m / 350 kHz




PPP-ZEILR-50 (Mode: Contact)
»óÇ°°¡°Ý :
Brand : Nanosensors   /    Coating: Al
Res. Rreq : 27kHz
Force Constant : 1.6N/m
¼ö·® : ¡â  ¡ä


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PPP-ZEILR
PPP-ZEILR-10 / PPP-ZEILR-20 / PPP-ZEILR-50 ´ÜÀ§ÆǸÅ
• PointProbe¢ç Plus silicon AFM probe, silicon AFM cantilever for contact mode, for Zeiss Veritekt AFM, detector side: Al coating
• Back side Reflex coating
• C = 1.6 N/m; fo = 27 kHz
PointProbe¢ç Plus ZEISS Veritekt Microscopes - Contact Mode Low Force Constant - Reflex Coating
The PointProbe¢ç Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS¢â PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

The AFM probe offers unique features:
guaranteed AFM tip radius of curvature < 10 nm
AFM tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Al coating on detector side of AFM cantilever
high mechanical Q-factor for high sensitivity
The reflective coating is an approximately 30 nm thick aluminium coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.



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